1.

Conference Proceedings

Conference Proceedings
Zorn,G. ; Kolodzey,J. ; Gobel,H. ; Fischer,T. ; Hanesch,P. ; Schwarz,R.
Pub. info.: EPDIC 1 : proceedings of the First European Powder Diffraction Conference held, March 14th - 16th, 1991. in Munich, Germany.  Pt.2  pp.887-892,  1991.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 79-82
2.

Conference Proceedings

Conference Proceedings
Vieira,M. ; Fantoni,A. ; Koynov,S. ; Schwarz,R.
Pub. info.: Photodetectors : materials and devices II : 12-14 February 1997, San Jose, California.  pp.183-192,  1997.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2999
3.

Conference Proceedings

Conference Proceedings
Schwarz,R. ; Vieira,M. ; Macarico,A. ; Koynov,S. ; Cardoso,S. ; Soares,J.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.593-598,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Christmann,P. ; Kreissl,J. ; Hoffmann,D.M. ; Meyer,B.K. ; Schwarz,R. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.779-783,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings

Conference Proceedings
Schwarz,R. ; Sun,J.J. ; Rocha,R. ; Morgado,E. ; Freitas,P.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1259-1264,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263