1.

Conference Proceedings
Conference Proceedings
1. Optical constants from synchrotron reflectance measurements of AXAF witness mirrors 2 to 12 keV
Graessle,D.E. ; Burek,A.J. ; Fitch,J.J. ; Harris,B. ; Schwartz,D.A. ; Blake,R.L.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.52-64,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
2.

Conference Proceedings
Conference Proceedings
2. Determination of optical constants for AXAF mirrors from 0.05 to 1.0 keV through reflectance measurements
Harris,B. ; Burek,A.J. ; Fitch,J.J. ; Graessle,D.E. ; Schwartz,D.A. ; Blake,R.L. ; Gullikson,E.M.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.40-51,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
3.

Conference Proceedings
Conference Proceedings
3. AXAF synchrotron witness mirror calibrations 2 to 12 keV
Fitch,J.J. ; Blake,R.L. ; Burek,A.J. ; Clark,A.M. ; Graessle,D.E. ; Harris,B. ; Schwartz,D.A. ; Sweeney,J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.30-39,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
4.

Conference Proceedings
Conference Proceedings
4. Dynamically programmable cache
Nakkar,M. ; Harding,J.A. ; Schwartz,D.A. ; Franzon,P.D. ; Conte,T.
Pub. info.: Configurable computing : technology and applications : 2-3 November 1998, Boston, Massachusetts.  pp.218-226,  1998.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3526
5.

Conference Proceedings
Conference Proceedings
5. Orbital measurement and verification of the Chandra X-ray Observatory's PSF
Jerius,D. ; Donnelly,R.H. ; Tibbetts,M.S. ; Edgar,R.J. ; Gaetz,T.J. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Zhao,P.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.17-27,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
6.

Conference Proceedings
Conference Proceedings
6. Absolute effective area of the Chandra high-resolution mirror assembly(HRMA)
Schwartz,D.A. ; David,L.P. ; Donnelly,R.H. ; Edgar,R.J. ; Gaetz,T.J. ; Graessle,D.E. ; Jerius,D. ; Juda,M. ; Kellogg,E.M. ; McNamara,B.R. ; Plucinsky,P.P. ; Speybroeck,L.P.Van ; Wargelin,B.J. ; Wolk,S. ; Dewey,D. ; Marshall,H.L. ; Schulz,N.S. ; Elsner,R.F. ; Kolodziejczak,J.J.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.28-40,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
7.

Conference Proceedings
Conference Proceedings
7. Orbital verification of the CXO high-resolution mirror assembly alignment and vignetting
Gaetz,T.J. ; Jerius,D. ; Edgar,R.J. ; Speybroeck,L.P.Van ; Schwartz,D.A. ; Markevitch,M.L. ; Taylor,S.C. ; Schulz,N.S.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.41-52,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
8.

Conference Proceedings
Conference Proceedings
8. Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV
Fitch,J.J. ; Graessle,D.E. ; Harris,B. ; Hughes,J.P. ; Nguyen,D.T. ; Schwartz,D.A. ; Blake,R.L.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.311-322,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
9.

Conference Proceedings
Conference Proceedings
9. Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples
Clark,A.M. ; Bruni,R.J. ; Romaine,S.E. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Yip,P.W. ; Drehman,A.J. ; Shapiro,A.P.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.268-276,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
10.

Conference Proceedings
Conference Proceedings
10. Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples
Bruni,R.J. ; Clark,A.M. ; Moran,J.F. ; Nguyen,D.T. ; Romaine,S.E. ; Schwartz,D.A. ; Speybroeck,L.P.Van
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.301-310,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805