1.

Conference Proceedings
Conference Proceedings
1. Lifetime testing of EUV optics using intense synchrotron radiation at the PTB Radiometry Laboratory
Klein,R. ; Gottwald,A. ; Scholze,F. ; Thornagel,R. ; Tummler,J. ; Ulm,G. ; Wedowski,M. ; Stietz,F. ; Mertens,B. ; Koster,N.B. ; Elp,J.van
Pub. info.: Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA.  pp.105-112,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4506
2.

Conference Proceedings
Conference Proceedings
2. Large-format distributed readout imaging devices for x-ray imaging spectroscopy
Hartog,R.H.den ; Kozorezov,A.G. ; Martin,D.D. ; Brammertz,G. ; Verhoeve,P. ; Peacock,A.J. ; Scholze,F. ; Goldie,D.J.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XII : 31 July and 2 August 2001 San Diego, USA.  pp.50-60,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4497
3.

Conference Proceedings
Conference Proceedings
3. Reflectivity of Mo/Si multilayer systems for EUVL
Louis,E. ; Yakshin,A.E. ; Corts,P.C. ; Abdali,S. ; Maas,E.L.C. ; Stuik,R. ; Bijkerk,F. ; Schmitz,D. ; Scholze,F. ; Ulm,G. ; Haidl,M.
Pub. info.: Emerging lithographic technologies III : 15-17 March 1999, Santa Clara, California.  Part2  pp.844-845,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3676
4.

Conference Proceedings
Conference Proceedings
4. Absolute calibration of ACIS x-ray CCDs using calculable undispersed synchrotron radiation
Bautz,M.W. ; Pivovaroff,M.J. ; Kissel,S.E. ; Prigozhin,G.Y. ; Isobe,T. ; Jones,S.E. ; Ricker,G.R. ; Thornagel,R. ; Kraft,S. ; Scholze,F. ; Ulm,G.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.53-67,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
5.

Conference Proceedings
Conference Proceedings
5. Progress in Mo/Si multilayer coating technology for EUVL optics
Louis,E. ; Yakshin,A.E. ; Gorts,P.C. ; Oestreich,S. ; Stuik,R. ; Maas,E.L.G. ; Kessels,M.J.H. ; Bijkerk,F. ; Haidl,M. ; Mullender,S. ; Mertin,M. ; Schmitz,D. ; Scholze,F. ; Ulm,G.
Pub. info.: Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA.  pp.406-411,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3997
6.

Conference Proceedings
Conference Proceedings
6. Mo/Si multiiayer coating technology for EUVL: coating uniformity and time stabllity
Louis,E. ; Yakshin,A.E. ; Gorts,P.C. ; Oestreich,S. ; Maas,E.L.G. ; Kessels,M.J.H. ; Schmitz,D. ; Scholze,F. ; Ulm,G. ; Mullender,S. ; Haidi,M. ; Bijkerk,F.
Pub. info.: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.60-63,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4146
7.

Conference Proceedings
Conference Proceedings
7. Multilayer reflectance during exposure to EUV radiation
Oestreich,S. ; Klein,R. ; Scholze,F. ; Jonkers,J. ; Louis,E. ; Yakshin,A.E. ; Gorts,P.C. ; Ulm,G. ; Haidl,M. ; Bijkerk,F.
Pub. info.: Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA.  pp.64-71,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4146
8.

Conference Proceedings
Conference Proceedings
8. Modeling the Chandra high-energy transmission gratings below 2 keV
Flanagan,K.A. ; Markert,T.H. ; Davis,J.E. ; Schattenburg,M.L. ; Blake,R.L. ; Scholze,F. ; Bulicke,P. ; Fliegauf,R. ; Kraft,S. ; Ulm,G. ; Gulikson,E.M.
Pub. info.: X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA.  pp.559-572,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4140
9.

Conference Proceedings
Conference Proceedings
9. Absolute calibration of the Chandra X-ray Observatory:transfer standard solid state detectors
Serej,S.R. ; Kellogg,E.M. ; Edgar,R.J. ; Scholze,F. ; Ulm,C.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.777-788,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765
10.

Conference Proceedings
Conference Proceedings
10. Quantum efficiency of the XMM pn-CCD camera
Hartmann,R. ; Hartner,G.D. ; Briel,U.C. ; Dennerl,K. ; Haberl,F. ; Struder,L. ; Trumper,J. ; Bihler,E. ; Kendziorra,E. ; Hochedez,J.-F.E. ; Jourdain,E. ; Dhez,P. ; Salvetat,P. ; Auerhammer,J.M. ; Scholze,F. ; Ulm,G.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado.  pp.703-713,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3765