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22 results

Conference Proceedings

1. High-accuracy calibration of the HXDS flow proportional counter for AXAF at the PTB Laboratory at BESSY

Auerhammer, J.M. ; Brandt, G. ; Scholze, F. ; Thornagel, R. ; Ulm, G. ; Wargelin, B.J. ; McDermott, W.C. ; Norton, T.J. ; Evans, I.N. ; Kellogg, E.M.

Pub. info.:	X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California. pp.19-29, 1998. Bellingham, Wash.. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3444

Conference Proceedings

2. Recent results on the factors govering the energy resolution in compound semiconductors to be used as future spectroscopic detectors for hard X-ray astronomy

Kraft, S. ; Peacock, T. ; Bavdaz, M. ; Owens, A. ; Gagliardi, M.-A. ; Nenonen, S. ; Scholze, F. ; Ulm, G. ; Tuomi, T. ; Juvonen, M. ; Rantamaki, R.

Pub. info.:	EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California. pp.236-246, 1998. Bellingham, Wash.. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3445

Conference Proceedings

3. X-ray CCD calibration for the AXAF CCD imaging spectrometer

Bautz, M. ; Pivovaroff, M. ; Baganoff, F. ; Isobe, T. ; Jones, S. ; Kissel, S. ; LaMarr, B. ; Manning, H. ; Prigozhin, G. ; Ricker, G. ; Nousek, J. ; Grant, C. ; Nishikida, K. ; Scholze, F. ; Thornagel, R. ; Ulm, G.

Pub. info.:	X-ray optics, instruments, and missions : 19-22 July 1998, San Diego, California. pp.210-224, 1998. Bellingham, Wash.. SPIE
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3444

Conference Proceedings

4. Compound Semiconductor Detectors for X-ray Astronomy: Spectroscopic Measurements and Material Characteristics

Bavdaz, M. ; Kraft, S. ; Peacock, A. ; Scholze, F. ; Wedowski, M. ; Ulm, G. ; Nenonen, S. ; Gagliardi, M-A. ; Gagliardi, T. ; Tuomi, T. ; Hjelt, K. T. ; Juvonen, M.

Pub. info.:	Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.565-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	487

Conference Proceedings

5. High-accuracy x-ray detector calibration at PTB

Krumrey, M. K. ; Scholze, F. ; Ulm, G.

Pub. info.:	High-energy detectors in astronomy : 22-23 June 2004, Glasgow, Scotland, United Kingdom. pp.277-285, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5501

Conference Proceedings

6. Irradiation of EUV multilayer optics with synchrotron radiation of a different time structure

Klein, R. ; Scholze, F. ; Thornagel, R. ; Tuemmler, J. ; Wedowski, M. ; Jansen, R. ; Mertens, B. ; van de Runstraat, A. ; Ulm, G.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.292-299, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

Conference Proceedings

7. Low thermal expansion substrate material for EUVL components application

Scholze, F. ; Laubis, C. ; Buchholz, C. ; Fischer, A. ; Ploger, S. ; Scholz, F. ; Wagner, H. ; Ulm, G.

Pub. info.:	Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA. pp.146-157, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5751

Technical Paper

8. Ion Beam Characterisation of the Rit 10 Ion Thruster

Zeuner, M. ; Scholze, F. ; Leiter, H.J. ; Kukies, R. ; Tartz, M.

Pub. info.:	AIAA paper. 2003. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.:	2003

Conference Proceedings

9. Plasma and Ion Beam Characterization by Non-conventional Methods

Kersten, H. ; Wiese, R. ; Kapitov, A. ; Scholze, F. ; Neumann, H.

Pub. info.:	Proceedings of Space Propulsion 2004, 4th International Spacecraft Propulsion Conference, 2nd Propellants for Space Propulsion, 3rd European Workshop on Hydrazine : 2-9 June 2004, Sardinia, Italy. 2004. Noordwijk, The Netherlands. ESA Publications Division
Title of ser.:	ESA SP
Ser. no.:	555

10.

Conference Proceedings

10. Rigorous FEM simulation of EUV masks: influence of shape and material parameters [6349-128]

Pomplun, J. ; Burger, S. ; Schmidt, F. ; Zschiedrich, L. ; Scholze, F. ; Laubis, C. ; Dersch, U.

Pub. info.:	Photomask Technology 2006. pp.63493D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6349

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