Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks IV. pp.62470H-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kowalsky W. ; Rabe T. ; Schneider D. ; Johannes H.-H. ; Karmutsch C. ; Gerken M. ; Lemmer U. ; Wang J. ; Weimann T. ; Hinze P. ; Riedl T. ; Technische Univ. Braunschweig (Germany)
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Nanosensing: Materials and Devices II. pp.60080Z-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering