1.

Conference Proceedings
Conference Proceedings
1. Shallow Acceptor States iu SiGe Quantum Wells
Kagan,M.S. ; Altukhov,I.V. ; Korolev,K.A. ; Orlov,D.V. ; Sinis,V.P. ; Thomas,S.G. ; Wang,K.L. ; Schmalz,K. ; Yassievich,I.N.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.233-236,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
2.

Conference Proceedings
Conference Proceedings
2. Resonance acceptor states and THz generation in uniaxially strained p-Ge
Altukhov,I.V. ; Chirkova,E.G. ; Kagan,M.S. ; Korolev,K.A. ; Sinis,V.P. ; Schmalz,K. ; Odnoblyudov,M.A. ; Yassievich,I.N.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.71-76,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Acceptor states in boron doped SiGe quantum wells
Schmalz,K. ; Kagan,M.S. ; Altukhov,I.V. ; Korolev,K.A. ; Orlov,D.V. ; Sinis,V.P. ; Tomas,S.G. ; Wang,K.L. ; Yassievich,I.N.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.91-96,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings
Conference Proceedings
4. New Thermal Donors and Processes Associated with Oxygen Clustering in Cz-Si at 600° C
Schmalz,K. ; Tittelbach,K. ; Emtsev,V.V. ; Daluda,Yu.N.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.667-672,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings
Conference Proceedings
5. Impact of Volume Defects on Gold Gettering in Cz-Si Wafers
Kirscht,F.-G. ; Schmalz,K. ; Babanskaya,I.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.237-242,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
6.

Conference Proceedings
Conference Proceedings
6. Electrical and Optical Properties of 3d- and 4d-Transition Metal Related Centers in Silicon
Schmalz,K. ; Grimmeiss,H.G. ; Pettersson,H. ; Tilly,L.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.809-814,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
7.

Conference Proceedings
Conference Proceedings
7. Acceptor states in boron doped SiGe quantum wells
Schmalz,K. ; Kagan,M.S. ; Altukhov,I.V. ; Korolev,K.A. ; Orlov,D.V. ; Sinis,V.P. ; Tomas,S.G. ; Wang,K.L. ; Yassievich,I.N.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1613-1618,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
8.

Conference Proceedings
Conference Proceedings
8. Point Defects in SiGe Epitaxial Layers and Bulk Crystals
Erzgraber,H.B. ; Kissinger,G. ; Krtiger,D. ; Morgenstern,T. ; Schmalz,K. ; Schilz,J. ; Kurten,M. ; Osinsky,A.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.489-494,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
9.

Conference Proceedings
Conference Proceedings
9. Electrical and optical properties of titanium,molybdenum and tungsten related defects in silicon
Schmalz,K. ; Grimmeiss,H.G. ; Pettersson,H. ; Tilly,L. ; Tit-telbach,K.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.239-244,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87