1.

Conference Proceedings
Conference Proceedings
1. QUALITY OF BULK CdTe SUBSTRATES AND ITS RELATION TO INTRINSIC DEFECTS
Meyer, B.K. ; Hofmann, D.M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.185-190,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
2.

Conference Proceedings
Conference Proceedings
2. Quality of bulk CdTe substrates and its relation to intrinsic defects
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Emanuelsson, P. ; Omling, P. ; Weigel, E. ; Muller-Vogt, G. ; Wienecke, F. ; Schenk, M.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.433-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302
3.

Conference Proceedings
Conference Proceedings
3. 16-O-01 - Simulating shape selectivity in alkane hydroconversion by zeolites
Schenk, M. ; Maesen, T.L.M. ; Smit, B.
Pub. info.: Zeolites and mesoporous materials at the dawn of the 21st century : proceedings of the 13th International Zeolite Conference, Montpellier, France, 8-13 July 2001.  pp.155-155,  2001.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 135
4.

Conference Proceedings
Conference Proceedings
4. Roughness parameters and surface deformation measured by "Coherence Radar"
Ettl, P. ; Schmidt, B. ; Schenk, M. ; Laszlo, I. ; Hausler, G.
Pub. info.: International Conference on Applied Optical Metrology.  pp.133-140,  1998.  Bellingham, Wash..  SPIE--International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3407