Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.129-136, 1985. Pittsburgh, Pa.. Materials Research Society
Beeler, F. ; Scheffler, M. ; Jepsen, O. ; Gunnarsson, O.
Pub. info.:
Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.117-122, 1985. Pittsburgh, Pa.. Materials Research Society
Scheffler, F. ; Zampieri, A. ; Schwieger, W. ; Scheffler, M.
Pub. info.:
Recent advances in the science and technology of zeolites and related materials : proceedings of the 14th International Zeolite Conference, Cape Town, South Africa, 25-30th April 2004. pp.647-653, 2004. Amsterdam. Elsevier