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51 results

Conference Proceedings

1. New structure and fabrication process for thermal-type microsensors

Han,J. ; Kadowaki,T. ; Sato,K. ; Shikida,M.

Pub. info.:	Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA. pp.386-394, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4557

Conference Proceedings

2. Self-alignment for microparts assembly using water surface tension

Sato,K. ; Hata,S. ; Shimokohbe,A.

Pub. info.:	Device and process technologies for MEMS and microelectronics : 27-29 October 1999, Royal Pines Resort, Queensland, Australia. pp.321-329, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3892

Conference Proceedings

3. Position-sensitive ionization chamber for diffraction studies at synchrotron sources

Sato,K. ; Toyokawa,H. ; Kohmura,Y. ; Ishikawa,T. ; Suzuki,M.

Pub. info.:	Detectors for crystallography and diffraction studies at synchrotron sources : 19 July 1999, Denver, Colorado. pp.114-121, 1999. Bellingham, Wash.: SPIE. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3774

Conference Proceedings

4. Performance of multiple-CCD x-ray detector system at Spring-8 for protein crystallography

Suzuki,M. ; Yamamoto,M. ; Kumasaka,T. ; Sato,K. ; Toyokawa,H. ; Ueki,T.

Pub. info.:	Detectors for crystallography and diffraction studies at synchrotron sources : 19 July 1999, Denver, Colorado. pp.38-45, 1999. Bellingham, Wash.: SPIE. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3774

Conference Proceedings

5. Subsingle-molecule determination of nonfluorescent species by scanning thermal lens microscope and its application to single-cell measurement

Kitamori,T. ; Uchida,M. ; Egami,A. ; Sekiguchi,K. ; Zheng,J. ; Sawada,T. ; Tokeshi,M. ; Sato,K. ; Kimura,H.

Pub. info.:	Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California. pp.67-72, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3922

Conference Proceedings

6. Electron-beam direct writing technology for fine gate patterning

Sato,K. ; Shirai,S. ; Hayakawa,H. ; Okazaki,S.

Pub. info.:	Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California. pp.326-333, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3331

Conference Proceedings

7. Transformer-driven stroboscopic x-ray generator SX-T98

Sato,E. ; Ichimaru,T. ; Usuki,T. ; Sato,K. ; Ojima,H. ; Takayama,K. ; Ido,H. ; Tamakawa,Y.

Pub. info.:	23rd International Congress on High-Speed Photography and Photonics : 20-25 September, 1998, Moscow, Russia. Part2 pp.644-651, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3516

Conference Proceedings

8. MIRA-II,MIRA-III,and MIRA-SG projects:the future plan of long-baseline optical/IR interferometer in Japan

Nishikawa,J. ; Sato,K. ; Fukushima,T. ; Yoshizawa,M. ; Machida,Y. ; Honma,Y.

Pub. info.:	Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii. Part 1 pp.184-191, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3350

Conference Proceedings

9. MIRA-I project:development of the Mitaka optical and infrared stellar interferometer

Machida,Y. ; Nishikawa,J. ; Sato,K. ; Fukushima,T. ; Yoshizawa,M. ; Honma,Y. ; Torii,Y. ; Matsuda,K. ; Kudo,K. ; Ohashi,M. ; Suzuki,S. ; Iwashita,H.

Pub. info.:	Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii. Part 1 pp.202-211, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3350

10.

Conference Proceedings

10. Development of the optical and infrared interferometer MIRA-I.2

Sato,K. ; Nishikawa,J. ; Yoshizawa,M. ; Fukushima,T. ; Machida,Y. ; Honma,Y. ; Kuwabara,R. ; Suzuki,S. ; Torii,Y. ; Kudo,K. ; Matsuda,K. ; Iwashita,H.

Pub. info.:	Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii. Part 1 pp.212-218, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3350

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