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9 results

1.

Conference Proceedings

1. Estimation of path length factor for measurement of haemoglobin concentration in the exposed cortical tissue [5859-27]

Sakaguchi, K. ; Tachibana, T. ; Yokoyama, K. ; Furukawa, S. ; Katsura, T. ; Maki, A. ; Kawaguchi, H. ; Okada, E.

Pub. info.:	Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590S-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5859

2.

Conference Proceedings

2. ELTRAN(R); SOI-Epi WaferTM by Epitaxial Layer Transfer from Porous Si

Yonehara, T. ; Sakaguchi, K.

Pub. info.:	Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium. pp.313-317, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-25

3.

Conference Proceedings

3. Mechanism of Pore-Enlargement in Double Porous Si Layers

Sakaguchi, K. ; Kurisu, H. ; Ohmi, K. ; Yonehara, T.

Pub. info.:	Pits and Pores : formation, properties, and significance for advanced materials : proceedings of the International Symposium. pp.318-325, 2000. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2000-25

4.

Conference Proceedings

4. Splittability in Double Porous Si Layers for ELTRAN

Sakaguchi, K. ; Tsuboi, T. ; Yanagita, K. ; Okabe, T. ; Takahashi, K. ; Sato, N.

Pub. info.:	Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.31-38, 2003. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-19

5.

Conference Proceedings

5. Epiaxial Layer Transfer by Bond and Etch-Back of Porous SI

Yonehara, T. ; Sakaguchi, K. ; Sato, N.

Pub. info.:	Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications. pp.47-55, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-7

6.

Conference Proceedings

6. Simulation of the fracture shear dilation

Fomin, S. ; Shimizu, A. ; Matsuki, K. ; Sakaguchi, K. ; Hashida, T.

Pub. info.:	Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 10-16 June, 2002, St. Petersburg, Russia. pp.216-221, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5127

7.

Conference Proceedings

7. ELTRAN (SOI-Epi Wafer) Technology

Yonehara, T. ; Sakaguchi, K.

Pub. info.:	Progress in SOI structures and devices operating at extreme conditions. pp.39-86, 2002. Dordrecht. Kluwer Academic Publishers
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	58

8.

Conference Proceedings

8. Scalable Potential and Volume Production in ELTRAN (R); SOI-Epi WafersTM

Sakaguchi, K. ; Yonehara, T.

Pub. info.:	Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia. pp.197-204, 2001. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-27

9.

Conference Proceedings

9. EPITAXIAL GROWTH ON POROUS Si FOR A NEW BOND AND ETCH-BACK SOI

Sato, N. ; Sakaguchi, K. ; Yamagata, K. ; Fujiyama, Y. ; Yonehara, T.

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.443-454, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-10

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