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14 results

Conference Proceedings

1. Development of a figure correction method having spatial resolution close to 0.1 mm

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.105-111, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

2. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.11-17, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

3. PREVENTION OF PARTICLE DEPOSITION IN HF SOLUTION

Saito, A. ; Ohta, K. ; Itoh, H. ; Oka, H.

Pub. info.:	Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.427-433, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-7

Conference Proceedings

4. Morpho-blue reproduced by nanocasting lithography [6327-39]

Saito, A. ; Nakajima, M. ; Miyamura, Y. ; Sogo, K. ; Ishikawa, Y. ; Hirai, Y.

Pub. info.:	Nanoengineering : fabrication, properties, optics, and devices III : 15-17 August, 2006, San Diego, California, USA. pp.63270Z-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6327

Conference Proceedings

5. Reproduction of the Morpho butterfly's blue: arbitration of contradicting factors

Saito, A. ; Yoshioka, S. ; Kinoshita, S.

Pub. info.:	Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA. pp.188-194, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5526

Conference Proceedings

6. Aspheric surface fabrication in nanometer-level accuracy by numerically controlled plasma chemical vaporization machining (CVM) and elastic emission machining (EEM)

Yamamura, K. ; Mimura, H. ; Yamauchi, K. ; Sano, Y. ; Saito, A. ; Kinoshita, T. ; Endo, K. ; Mori, Y. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.265-270, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

Conference Proceedings

7. Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics

Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Kanaoka, M. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Mori, Y.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.271-276, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

Conference Proceedings

8. Submicron focusing of hard x-ray beam by elliptically figured mirrors for scanning x-ray microscopy

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Ueno, K. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.58-64, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

Conference Proceedings

9. METAL ADSORPTION MECHANISM ON SI WAFER

Takahara, Y. ; Saito, A. ; Oka, H.

Pub. info.:	Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.269-276, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-20

10.

Technical Paper

10. Study on Fuel Economy and NOx Emissions of Medium Duty Hybrid Truck in Real Traffic Conditions.

Takada, Y. ; Ueki, S. ; Saito, A.

Pub. info.:	2004 SAE world congress : technical paper. 2004. Warrendale, Penn.. Society of Automotive Engineers
Title of ser.:	Society of Automotive Engineers technical paper series
Ser. no.:	2004

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