1.

Conference Proceedings
Conference Proceedings
1. Effect of Shape of Crystal-Melt Interface on Point Defect Reaction in Silicon Crystals
Nakamura,K. ; Maeda,S. ; Togawa,S. ; Saishoji,T. ; Tomioka,J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.31-43,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
2.

Conference Proceedings
Conference Proceedings
2. The Formation Mechanism of Coupled Voids in Czochralski Silicon
Ishikawa,F. ; Sadohara,S. ; Saishoji,T. ; Nakamura,K. ; Tomioka,J.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.86-96,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218