1.

Conference Proceedings
Conference Proceedings
1. SOI for CMOS Logic and Memory Applications*
Sadana, D.K.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.474-488,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-2
2.

Conference Proceedings
Conference Proceedings
2. A Survey of Defects in Strained Si Layers
Bedell, S.W. ; Chen, H. ; Sadana, D.K. ; Fogel, K. ; Domenicucci, A.
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.39-44,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
3.

Conference Proceedings
Conference Proceedings
3. LOW-ENERGY IMPLANTATION OF Si AND Sn INTO GaAs
Rubart, W.S. ; Jones, K.S. ; Seiberling, L. ; Sadana, D.K.
Pub. info.: Beam-solid interactions : physical phenomena : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.677-682,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 157
4.

Conference Proceedings
Conference Proceedings
4. Ge+PREAMORPHIZATION OF Si: EFFECTS OF DOSE AND VERY LOW TEMPERATURE THERMAL TREATMENT ON EXTENDED DEFECT FORMATION DURING SUBSEQUENT SPE
Myers, E. ; Rozgonyi, G.A. ; Sadana, D.K. ; Maszara, W. ; Wortman, J.J. ; Narayan, J.
Pub. info.: Rapid thermal processing : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A..  pp.107-114,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 52
5.

Conference Proceedings
Conference Proceedings
5. INTERFACIAL TUNNEL STRUCTURES IN CMOS SOURCE/DRAIN REGIONS FOLLOWING SELECTIVE DEPOSITION OF TUNGSTEN
DeBlasi, J.M. ; Sadana, D.K. ; Norcott, M.H.
Pub. info.: Materials issues in silicon integrated circuit processing : symposium held April 15-18, 1986, Palo Alto, California, U.S.A..  pp.303-308,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 71
6.

Conference Proceedings
Conference Proceedings
6. Non-Destructive Evaluation of Interfaces in BSOI Structures using the Picosecond Ultrasonics Technique
Sadana, D.K. ; Hao, H.-Y. ; Maris, H.J.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.358-364,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
7.

Conference Proceedings
Conference Proceedings
7. Characterization of ultra thin SOI and SSOI substrates: defect and strain analysis Invited
Bedell, S.W. ; Hovel, H. ; Domenicucci, A. ; Fogel, K. ; Reznicek, A. ; Sadana, D.K.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.345-356,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
8.

Conference Proceedings
Conference Proceedings
8. Effects of damage-impurity interaction on electrical properties of Se+-implanted GaAs
Sadana, D.K. ; Washburn, J. ; Strathman, D. ; Booker, G.R. ; Badawi, M.H.
Pub. info.: Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.515-519,  1981.  New York.  North Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 2
9.

Conference Proceedings
Conference Proceedings
9. A Patterned SOI by Masked Anneal for System-On-Chip Applications
Cohen, G.M. ; Sadana, D.K.
Pub. info.: Materials issues in novel si-based technology : symposium held November 26-28, 2001, Boston, Massachusetts, U.S.A..  pp.53-58,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 686
10.

Conference Proceedings
Conference Proceedings
10. HIGH DOSE IMPLANTATION OF NICKEL INTO SILICON
Campisi, G.J. ; Dietrich, H.B. ; Delfino, M. ; Sadana, D.K.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.747-752,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54