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45 results

Conference Proceedings

1. Nucleation Control for High Density Formation of Si-based Quantum Dots on Ultrathin SiO₂

K. Makihara ; A. Kawanami ; M. Ikeda ; S. Higashi ; S. Miyazaki

Pub. info.:	SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices. pp.255-260, 2008. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(10)

Conference Proceedings

2. Effect of Cold-Rolling Rate on Texture in Ti-Mo-Al-Zr Shape Memory Alloy

K. Hiramatsu ; M. Tahara ; T. Inamura ; H. Hosoda ; S. Miyazaki

Pub. info.:	European Symposium on Martensitic Transformations : Selected, peer reviewed papers from the 9th European Symposium on Martensitic Transformations ESOMAT 2012, September 9-16, 2012, Saint-Petersburg, Russia. pp.262-266, 2013. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	738-739

Conference Proceedings

3. Microscopic Understanding of PBTI and NBTI Mechanisms in High-κ / Metal Gate Stacks

M. Sato ; K. Yamabe ; K. Shiraishi ; S. Miyazaki ; K. Yamada

Pub. info.:	Physics and technology of high-k gate dielectrics 5. pp.615-627, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(4)

Conference Proceedings

4. Stability of Ti-Ta Base High Temperature Shape Memory Alloys

H.Y. Kim ; T. Kanaya ; T. Fukushima ; P.J.S. Bueconsejo ; S. Miyazaki

Pub. info.:	THERMEC 2011 : International Conference on Processing & Manufacturing of Advanced Materials : processing, fabrication, properties, applications, August 1-5, 2011, Quebec City, Canada. pp.1921-1924, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	706-709

Conference Proceedings

5. The Influence of Defects and Impurities on Electrical Properties of High-k Dielectrics

J. Dabrowski ; S. Miyazaki ; S. Inumiya ; G. Kozlowski ; G. Lippert

Pub. info.:	Advances in electronic materials : special topic volume with invited papers only. pp.55-110, 2009. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	608

Conference Proceedings

6. Characterization of Electronic Charged States of Si-Based Quantum Dots for Floating Gate Application

S. Miyazaki ; M. Ikeda ; K. Makihara

Pub. info.:	ULSI process integration 5. pp.233-243, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(6)

Conference Proceedings

7. Deformation Texture of Ti-26mol%Nb-3mol%Al β-Titanium Alloy

T. Inamura ; R. Shimizu ; H. Hosoda ; S. Miyazaki

Pub. info.:	THERMEC 2011 : International Conference on Processing & Manufacturing of Advanced Materials : processing, fabrication, properties, applications, August 1-5, 2011, Quebec City, Canada. pp.1899-1902, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	706-709

Conference Proceedings

8. Formation of High Density Metal Silicide Nanodots on Ultrathin SiO₂ for Floating Gate Memory Application

S. Miyazaki ; M. Ikeda ; K. Makihara ; K. Shimanoe ; R. Matsumoto

Pub. info.:	THERMEC 2009, 6th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS, Berlin, Germany, August 25-29, 2009. pp.1725-1730, 2010. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	638-642

Conference Proceedings

9. Mechanical Properties of Ti-Fe-Sn Biomedical Alloys with or without Aging Treatment

H. Hosoda ; K. Kasuya ; M. Tahara ; T. Inamura ; S. Miyazaki

Pub. info.:	THERMEC 2013 : Selected, peer reviewed papers from the 8th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS Processing, Fabrication, Properties, Applications, December 2-6, 2013, Las Vegas, USA. pp.2423-2428, 2014. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	783-786

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Conference Proceedings

10. Characterization of Charge Trapping and Dielectric Breakdown of HfAlOx/SiON Dielectric Gate Stack

Y. Pei ; S. Nagamachi ; H. Murakami ; S. Higashi ; S. Miyazaki ; T. Kawahara ; K. Torii ; Y. Nara

Pub. info.:	Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5. pp.163-172, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(1)

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Author: S. Miyazaki