1.

Conference Proceedings
Conference Proceedings
1. Viscosity Measurements of Zr55Cu30Al10Ni5 Supercooled Liquid Alloy under High-Speed Heating Conditions
T. Yamasaki ; S. Maeda ; D. Okai ; T. Fukami ; Y. Yokoyama ; N. Nishiyama ; H. Kimura ; A. Inoue
Pub. info.: THERMEC 2006 : supplement to THERMEC 2006, 5th International conference on processing and manufacturing of advanced materials, July 4-8, 2006, Vancouver, Canada.  539-543  pp.2071-2076,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 539-543(2)
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Polyimides as a Gate Insulator for Organic Transistors
S. Maeda ; G. Ono
Pub. info.: State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLIII) and Nitride and Wide Bandgap Semiconductors for Sensors, Photonics, and Electronics VI.  pp.155-157,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(2)
3.

Technical Paper
Technical Paper
3. Automatic Thrust and Mixture Ratio Control of LE-X
H. Sunakawa ; A. Kurosu ; K. Okita ; W. Sakai ; S. Maeda ; A. Ogawara
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 2008
4.

Conference Proceedings
Conference Proceedings
4. Viscous Flow Behaviors of Supercooled Liquids of Pre-Annealed Zr55Cu30Al10Nip5 Bulk Metallic Glasses
T. Yamasaki ; S. Maeda ; T. Kikuchi ; T. Fukami ; Y. Yokoyama ; T. Yamamoto ; H. Kimura ; A. Inoue
Pub. info.: PRICM 6 : selected, peer reviewed papers from The sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea.  561-565  pp.1271-1274,  2007.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 561-565
5.

Conference Proceedings
Conference Proceedings
5. Novel method for quality assurance of two-dimensional pattern fidelity
S. Maeda ; R. Ogawa ; S. Shibazaki ; T. Nakajima
Pub. info.: Design for manufacturability through design-process integration : 28 February-2 March 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6521
6.

Conference Proceedings
Conference Proceedings
6. Single-frequency 389-nm CW coherent light source for optical pumping of metastable 3He atoms
S. Maeda ; Y. Tabata ; H. Kumagai ; A. Kobayashi
Pub. info.: Nonlinear frequency generation and conversion : materials, devices, and applications VII : 22-24 January 2008, San Jose, California, USA.  pp.68751B-1-68751B-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6875
7.

Conference Proceedings
Conference Proceedings
7. Accurate model base verification scheme to eliminate hotspots and manage warmspots
S. Nojima ; S. Kyoh ; S. Maeda ; S. Inoue
Pub. info.: Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA.  pp.69250Z-1-69250Z-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6925
8.

Conference Proceedings
Conference Proceedings
8. Concurrent development methodology from design rule to OPC in 45-nm node logic device
K. Konomi ; S. Nojima ; S. Maeda ; T. Fujimaki ; H. Igarashi
Pub. info.: Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA.  pp.692512-1-692512-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6925
9.

Conference Proceedings
Conference Proceedings
9. Novel method for quality assurance of two-dimensional pattern fidelity and its validation
S. Maeda ; R. Ogawa ; S. Shibazaki ; T. Nakajima
Pub. info.: Photomask and next-generation lithography mask technology XIV.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6607