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12 results

Conference Proceedings

1. Low Resistance Ohmic Contact Formation on 4H-SiC C-Face with NbNi Silicidation Using Nanosecond Laser Annealing

M. de Silva ; S. Ishikawa ; T. Kikkawa ; S.I. Kuroki

Pub. info.:	Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy. pp.549-552, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	858

Conference Proceedings

2. Characterization of 4H-SiC nMOSFETs in Harsh Environments, High-Temperature and High Gamma-Ray Radiation

S.I. Kuroki ; H. Nagatsuma ; M. de Silva ; S. Ishikawa ; T. Maeda

Pub. info.:	Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy. pp.864-867, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	858

Conference Proceedings

3. Improvements of Feedback Control Algorism in Two-Dimensional Vector Magnetic Property Measurements

T. Todaka ; T. Sato ; S. Ishikawa ; Y. Maeda ; M. Enokizono

Pub. info.:	Applied electromagnetic engineering : for magnetic superconducting and nanomaterials : Selected, peer reviewed papers from the 6th Japanese-Mediterranean Workshop on Applied Electromagnetic Engineering for Magnetic Superconducting and Nano Materials, organized in Bucharest, Romania in July 27-29 2009. pp.327-335, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	670

Conference Proceedings

4. Development and Application of a New Electronic Personal Dosimeter

M. Fujita ; K. Taniguchi ; K. Muramatsu ; S. Ishikawa ; H. Yamakawa

Pub. info.:	Plant Operations and maintenance, major component reliability and materials issues : presented at 8th International Conference on Nuclear Engineering, Baltimore, Maryland, April 2-6, 2000. 1 pp.275-278, 2000. New York. American Society of Mechanical Engineers
Title of ser.:	ASME Symposia Volumes
Ser. no.:	ICONE 8(1)

Conference Proceedings

5. 4H-SiC nMOSFETs with As-Doped S/D and NbNi Silicide Ohmic Contacts

H. Nagatsuma ; S.I. Kuroki ; M. de Silva ; S. Ishikawa ; T. Maeda

Pub. info.:	Silicon Carbide and Related Materials 2015 : [ICSCRM 2015] : selected, peer reviewed papers from the 16th International Conference on Silicon Carbide and Related Materials, October 4-9, 2015, Giardini Naxos, Italy. pp.573-576, 2016. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	858

Conference Proceedings

6. Phase Equilibria between γ-Fe (A1) and Fe₂Ti Laves (C14) Phases and Microstructure in Fe-Ti-Ni Ternary System at Elevated Temperatures

T. Sugiura ; S. Ishikawa ; T. Matsuo ; M. Takeyama

Pub. info.:	PRICM 6 : selected, peer reviewed papers from The sixth Pacific Rim International Conference on Advanced Materials and Processing, November 5-9, 2007, ICC Jeju, Jeju Island, Korea. 561-565 pp.435-438, 2007. Uetikon-Zuerich. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	561-565

Conference Proceedings

7. Enhanced-Oxidation and Interface Modification on 4H-SiC(0001) Substrate Using Alkaline Earth Metal

K. Muraoka ; H. Sezaki ; S. Ishikawa ; T. Maeda ; T. Sato ; T. Kikkawa ; S.I. Kuroki

Pub. info.:	Silicon Carbide and Related Materials 2016. pp.348-351, 2017. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	897

Conference Proceedings

8. 4H-SiC Pseudo-CMOS Logic Inverters for Harsh Environment Electronics

S.I. Kuroki ; T. Kurose ; H. Nagatsuma ; S. Ishikawa ; T. Maeda ; H. Sezaki ; T. Kikkawa ; T. Makino ; T. Ohshima ; M. Östling ; C.M. Zetterling

Pub. info.:	Silicon Carbide and Related Materials 2016. pp.669-672, 2017. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	897

Conference Proceedings

9. Application of double-sided silicon strip detectors to Compton cameras

H. Aono ; S. Takeda ; S. Ishikawa ; H. Odaka ; M. Kokubun

Pub. info.:	High energy, optical, and infrared detectors for astronomy III. pp.70211G-1-70211G-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7021

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Conference Proceedings

10. A new registration method with voxel-matching technique for temporal subtraction images

Y. ltai ; H. Kim ; S. Ishikawa ; S. Katsuragawa ; K. Doi

Pub. info.:	Medical imaging 2008. 2 pp.69153I-1-69153I-9, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6915

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Author: S. Ishikawa