1.

Conference Proceedings
Conference Proceedings
1. Defects Limiting Minorty Carrier Lifetime in 4H-SiC Epilayers
P. B. Klein ; B. Shanabrook ; S. Huh ; A. Polyakov ; M. Skowronski ; J. Sumakeris ; M. O'Loughlin
Pub. info.: State-of-the-art program on compound semiconductors 45 (SOTAPOCS 45) and wide bandgap semiconductor materials and devices 7.  pp.19-28,  2006.  Pennington, N.J.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(5)
2.

Technical Paper
Technical Paper
2. A Vision-Based Landing System for Fixed-Wing UAVs Using an Inflated Airbag
D. Shim ; S. Huh ; B. Min
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Guidance Navigation and Control Conference
Ser. no.: 2008
3.

Conference Proceedings
Conference Proceedings
3. Benchmarking EUV mask inspection beyond O.25 NA
K. A. Goldberg ; I. Mochi ; P. P. Naulleau ; H. Han ; S. Huh
Pub. info.: Photomask technology 2008.  2  pp.71222E-1-71222E-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7122
4.

Conference Proceedings
Conference Proceedings
4. Lifetime of EUVL as a function of degree of carbon contamination and capping materials
S. Huh ; H. Kim ; G. Yoon ; J. Choi ; H.-S. Lee
Pub. info.: Emerging lithographic technologies XII.  1  pp.692115-1-692115-9,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6921