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Conference Proceedings

1. Effects of Spatial and Spectral Characteristics of Electrons on Quantum Capacitance Oscillations in Silicon NanoWire-Based MOS Structure

S. Chin ; V. Ligatchev

Pub. info.:	One-Dimensional Nanoscale Electronic and Photonic Devices 2. pp.27-32, 2009. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(33)

Conference Proceedings

2. Tunnel ionization of atoms and molecules in an intense CO₂ laser field

S. Chin ; F.A. Ilkov ; T.D.G. Walsh ; F. Châteauneuf ; T. Nguyen-Dang

Pub. info.:	Second International Conference on Optoelectronic Science and Engineering '94 : 15-18 August 1994, Beijing, China. pp.254-258, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2321

Conference Proceedings

3. Novel method of under-etch defect detection for contact layers based on Si substrate using optic wafer inspection tools

B. Lee ; J. Choi ; S. Chin ; D. Cho ; C. Song

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

Conference Proceedings

4. A multiplexed CW Brillouin system for precise interrogation of a sensor array made from short discrete sections of optical fibre

J. P. Dakin ; S. Chin ; L. Thévenaz

Pub. info.:	19th International Conference on Optical Fibre Sensors. 2 pp.70046L-1-70046L-4, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7004