1.

Conference Proceedings
Conference Proceedings
1. Critical Parameters of Solution Design for Electrodeposition of 2.4 T CoFe Alloys
S.R. Brankovic ; J. George ; S. Bae ; D. Litvinov
Pub. info.: Magnetic Materials, Processes, and Devices 10.  pp.75-87,  2009.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(45)
2.

Conference Proceedings
Conference Proceedings
2. Electrochemical Transducers - A New Approach to Ultrasound Sensor Design
A. Shamsi ; S. Bae ; G. Majkic ; S.R. Brankovic
Pub. info.: Sensor Arrays and Multi-Dimensional Sensor Systems.  pp.15-23,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(16)
3.

Conference Proceedings
Conference Proceedings
3. The Analysis of the Cu Surface Morphology Evolution During Electropolishing
S. Shivareddy ; S. Bae ; S.R. Brankovic
Pub. info.: Chemical Mechanical Polishing 9.  pp.21-32,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 13(4)
4.

Conference Proceedings
Conference Proceedings
4. High Performance Metal Gate CMOSFETs with Aggressively Scaled Hf-Based High-k
S. Song ; G. L. Zhang ; S. Bae ; P. Kirsch ; P. Majhi ; R. Choi ; B. Lee
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.609-624,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)
5.

Technical Paper
Technical Paper
5. Scalable Millimeter Wave Wireless Power Receiver Technology for Space Applications
M. Mojarradi ; G. Chattopadhyay ; H. Manohara ; T. Vo ; H. Mojaradi ; S. Bae ; N. Marzwell
Pub. info.: AIAA meeting papers on disc.  2008.  Reston, Va..  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Space Conference and Exposition
Ser. no.: 2008
6.

Conference Proceedings
Conference Proceedings
6. Leakage characteristics for the buried photodiode structure on vertical CMOS image sensors
S. Lee ; S. Lim ; C. Lee ; J. Park ; S. Bang ; S. Kang ; R. A. Martin ; S. Bae ; J. W. Park
Pub. info.: Digital photography III : 29-30 January 2007, San Jose, California, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6502
7.

Conference Proceedings
Conference Proceedings
7. Improvement of mask CD uniformity for below 45-nm node technology
H. Lee ; S. Bae ; J. Park ; D. Nam ; B. Kim
Pub. info.: Photomask technology 2007.  2  pp.67302Z-1-67302Z-7,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6730
8.

Conference Proceedings
Conference Proceedings
8. Development of mid-wave 320x256 infrared focal plane array in Korea
J. Choi ; S. H. Kim ; C. Y. Kim ; J. W. Kim ; N. H. Kim ; S. Park ; S. Bae ; Y. Kim ; B. Kim ; M. Jeoung ; H. Jung
Pub. info.: Infrared technology and applications XXXIII : 9-13 April 2007, Orlando, Florida, USA.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6542