Polarization measurement, analysis, and applications V : 8-9 July 2002, Seattle, USA. pp.9-19, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Cantoni, C. ; Christen, D.K. ; Goyal, A. ; Heatherly, L. ; Ownby, G.W. ; Zehner, D.M. ; Norton, D.P. ; Rouleau, C.M. ; Christen, H.M.
Pub. info.:
Materials for high-temperature superconductor technologies : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.349-356, 2002. Warrendale, Pa.. Materials Research Society