Baylet, J. ; Zanatta, J.-P. ; Chance, D. ; Gravrand, O. ; Rothan, F. ; De Borniol, E. ; Castelein, P. ; Chamonal, J.-P. ; Ravetto, M. ; Destefanis, G.L.
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Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA. pp.134-143, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Casteiein, P. ; Guellec, F. ; Rothan, F. ; Martin, S. ; Bois, P. ; Costard, E. ; Huet, O. ; Marcadet, X. ; Nedelcu, A.
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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.804-815, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
de Borniol, E. ; Baylet, J.P. ; Zanatta, J.-P. ; Mibord, S. ; Gravrand, O. ; Rothan, F. ; Castelein, P. ; Chamonal, J.-P. ; Ravetto, M. ; Destefanis, G.L.
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Infrared Technology and Applications XXVIII. Part Two pp.491-499, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering