1.

Conference Proceedings
Conference Proceedings
1. EUV mask fabrication with Cr absorber
Mangnat,P.J. ; Hector,S.D. ; Rose,S. ; Cardinale,G.F. ; Tenjil,E. ; Stivers,A.R.
Pub. info.: Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA.  pp.76-82,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3997
2.

Conference Proceedings
Conference Proceedings
2. Dependence of EM performance on linewidth for Cu dual-inlaid structures
Zhao,L. ; Capasso,C. ; Marathe,A. ; Thrasher,S. ; Hernandez,R. ; Mulski,P. ; Rose,S. ; Nguyen,T. ; Gall,M. ; Kawasaki,H.
Pub. info.: Microelectronic Yield, Reliability, and Advanced Packaging.  pp.13-20,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4229
3.

Conference Proceedings
Conference Proceedings
3. Electromigration failure modes and Blech effect in single-inlaid Cu interconnects
Thrasher,S. ; Capasso,C. ; Zhao,L. ; Hernandez,R. ; Mulski,P. ; Rose,S. ; Nguyen,T. ; Kawasaki,H.
Pub. info.: Microelectronic Yield, Reliability, and Advanced Packaging.  pp.1-7,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4229
4.

Conference Proceedings
Conference Proceedings
4. Field and laboratory comparison of the sensitivity and reliability of cocaine detection on currency using chemical sensors,humans,K-9s,and SPME/GC/MS/MS analysis
Furton,K.G. ; Hsu,Y.-L. ; Luo,T. ; Norelus,A. ; Rose,S.
Pub. info.: Investigation and Forensic Science Technologies.  pp.41-46,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3576