1.

Conference Proceedings

Conference Proceedings
Onaka, T. ; Ishihara, D. ; Ootsubo, T. ; Chan, K.-W. ; Yamamura, I. ; Murakami, H. ; Tanabe, T. ; Roellig, T.L. ; Cohen, M.
Pub. info.: The Calibration legac of the ISO mission 5-9 February 2001, ISO Data Centre, Villafranca del Castillo, Madrid, Spain (VILSPA).  pp.119-122,  2003.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 481
2.

Conference Proceedings

Conference Proceedings
Lawrence, C.R. ; Eisenhardt, P. ; Emming, J.G. ; Finley, P.T. ; Gautier, T.N. ; Helou, G. ; Hopkins, R.A. ; Johnson, G.B. ; Keene, J. ; Kwok, J.H. ; Lee, J.H. ; Nieczkoski, S.J. ; Roellig, T.L. ; Schweickart, R.B.
Pub. info.: IR Space Telescopes and Instruments.  Part One  pp.153-161,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4850
3.

Conference Proceedings

Conference Proceedings
Ennico, K.A. ; Sandford, S. ; Allamandola, L. ; Bregman, J.D. ; Cohen, M. ; Cruikshank, D. ; Greene, T.P. ; Hudgins, D. ; Kwok, S. ; Lord, S.D. ; Madden, S. ; McCreight, C.R. ; Roellig, T.L. ; Strecker, D.W. ; Tielens, A.G.G.M. ; Werner, M.W.
Pub. info.: IR Space Telescopes and Instruments.  Part Two  pp.1149-1160,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4850
4.

Conference Proceedings

Conference Proceedings
Rieke, M.J. ; Baum, S.A. ; Beichman, C.A. ; Crampton, D. ; Doyon, R. ; Eisenstein, D. ; Greene, T.P. ; Hodapp, K.-W. ; Horner, S.D. ; Johnstone, D. ; Lesyna, L. ; Lilly, S. ; Meyer, M. ; Martin, P. ; McCarthy, D.W. ; Rieke, G.H. ; Roellig, T.L. ; Stauffer, J. ; Trauger, J.T. ; Young, E.T.
Pub. info.: IR Space Telescopes and Instruments.  Part One  pp.478-485,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4850