Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California. Part 2 pp.920-929, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry V : 19-21 July 1999, Denver, Colorado. pp.286-299, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hyperspectral remote sensing and application : 15-17 September 1998, Beijing, China. pp.201-208, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Micro-opto-electro-mechanical systems : 22-23 May 2000, Glasgow, Scotland, United Kingdom. pp.62-73, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Painter,T.H. ; Roberts,D.A. ; Green,R. O. ; Dozier,J.
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Imaging spectrometry III : 28-30 July 1997, San Diego, California. pp.120-131, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Roberts,D.A. ; Gardner,M. ; Church,R. ; Ustin,S. L. ; Green,R. O.
Pub. info.:
Imaging spectrometry III : 28-30 July 1997, San Diego, California. pp.108-119, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Hyperspectral remote sensing of the land and atomosphere : 9-12 October 2000, Sendai, Japan. pp.197-204, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Imaging spectrometry VI : 31 July - 2 August 2000, San Diego, USA. pp.40-48, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Process, Equipment, and Materials Control in Integrated Circuit Manufacturing. pp.113-124, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering