1.

Conference Proceedings
Conference Proceedings
1. DEGRADATION OF POROUS Si LAYERS CAUSED BY THERMAL TREATMENT
Munder, H. ; Berger, M.G. ; Frohnhoff, S. ; Luth, H. ; Rossow, U. ; Frotscher, U. ; Richter, W.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.281-286,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
2.

Conference Proceedings
Conference Proceedings
2. ASSESSMENT OF SURFACE DAMAGE OF GALLIUM ARSENIDE DUE TO REACTIVE ION ETCHING
Puttock, M. S. ; Thomas, H. ; Morgan, D. V. ; Rossow, U. ; Zahn, D. R. T. ; Richter, W. ; Hilton, K. P. ; Woodward, J.
Pub. info.: Plasma processing and synthesis of materials III : symposium held April 17-19, 1990, San Francisco, California, U.S.A..  pp.255-260,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 190
3.

Conference Proceedings
Conference Proceedings
3. MBE GROWN GaAs ON Si (100) STUDIED BY INFRARED SPECTROSCOPY
Eickhoff, T. ; Morley, S. ; Zahn, D.R.T. ; Richter, W. ; Woolf, D.A. ; Westwood, D.I. ; Wiliams, R.H.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.493-498,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
4.

Conference Proceedings
Conference Proceedings
4. FEASIBILITY OF SIMOX MATERIAL QUALITY DETERMINATION USING SPECTROELLIPSOMETRY: COMPARISON WITH RAMAN AND PLANAR VIEW TRANSMISSION ELECTRON MICROSCOPY
Crean, G. M. ; Lynch, S. ; Greef, R. ; Stoemenos, J. ; Rossow, U. ; Richter, W.
Pub. info.: Phase formation and modification by beam-solid interactions : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.139-144,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 235
5.

Conference Proceedings
Conference Proceedings
5. In- Situ Characterization of Epitaxial Semiconductor Growth by Reflectance Anisotropy Spectroscopy
Bhattacharya, A. ; Haberland, K. ; Poser, F. ; Zettler, J.T. ; Zorn, M. ; Weyers, M. ; Richter, W.
Pub. info.: Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001).  VOL-2  pp.990-995,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4746
6.

Conference Proceedings
Conference Proceedings
6. COHERENT ANTI-STROKE RAMAN SCATTERING MEASUREMENTS OF GROUP V HYDRINE AND TRIMETHYLGALLIUM DECOMPOSITION IN ORGANOMETALLIC VAPOR PHASE EPITAXY
Luckerant, R. ; Koss, H.J. ; Tommack, P. ; Richter, W. ; Balk,P.
Pub. info.: Chemical perspectives of microelectronic materials : symposium held November 30-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.91-96,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 131
7.

Conference Proceedings
Conference Proceedings
7. CONTRIBUTION OF THE NANOCRYSTALLITES AND THEIR INTERFACES TO THE OPTICAL RESPONSE OF POROUS SILICON LAYERS
Rossow, U. ; Frotscher, U. ; Richter, W. ; Muender, H. ; Thoennissen, M. ; Berger, M.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.429-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
8.

Conference Proceedings
Conference Proceedings
8. *Correlation of InGaP(001) surface structure during growth and CuPtB-type bulk ordering
Zorn, M. ; Kurpas, P. ; Bhattacharya, A. ; Weyers, M. ; Zettler, J-T. ; Richter, W.
Pub. info.: Self-organized processes in semiconductor alloys : symposium held November 29-December 2, 1999 Boston, Massachusetts, U.S.A..  pp.217-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 583
9.

Conference Proceedings
Conference Proceedings
9. REAL TIME CONTROL OF III-V SEMICONDUCTOR SURFACES DURING MOVPE GROWTH BY REFLECTANCE ANISOTROPY SPECTROSCOPY
Ploska, K. ; Richter, W. ; Reinhardt, F. ; Jonsson, J. ; Rumberg, J. ; Zorn, M.
Pub. info.: Gas-phase and surface chemistry in electronic materials processing : symposium held November 29-December 2, 1993, Boston, Massachusetts, U.S.A..  pp.155-,  1994.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 334
10.

Conference Proceedings
Conference Proceedings
10. Metal organic vapor phase epitaxy of GaAsN/GaAs quantum wells using tertiarybutylhydrazine
Schmidtling, T. K. ; Klein, M. ; Pohl, U. W. ; Richter, W.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W3.43.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595