1.

Conference Proceedings

Conference Proceedings
Poglitsch, A. ; Katterloher, R.O. ; Hoenle, R. ; Beeman, J.W. ; Haller, E.E. ; Richter, H. ; Groezinger, U. ; Haegel, N.M. ; Krabbe, A.
Pub. info.: Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA.  pp.115-128,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4855
2.

Conference Proceedings

Conference Proceedings
Mertens, P. ; Richter, H.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.455-457,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
3.

Conference Proceedings

Conference Proceedings
Kissinger, G. ; Vanhellemont, J. ; Lambert, U. ; Dornberger, E. ; Sorge, R. ; Morgenstern, G. ; Grabolla, T. ; Graef, D. ; von Ammon, W. ; Wagner, P. ; Richter, H.
Pub. info.: Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology.  pp.1095-1112,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-1(2)
4.

Conference Proceedings

Conference Proceedings
Richter, H. ; Stabernack, B. ; Mueller, E.
Pub. info.: Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA.  pp.490-498,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5203
5.

Conference Proceedings

Conference Proceedings
Kissinger, G. ; Morgenstern, G. ; Grabolla, T. ; Richter, H. ; Vanhellemont, J. ; Lambert, U. ; Graef, D.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.158-169,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
6.

Conference Proceedings

Conference Proceedings
Kissinger, G. ; Vanhellemont, J. ; Graef, D. ; Zulehner, W. ; Claeys, C. ; Richter, H.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.156-164,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
7.

Conference Proceedings

Conference Proceedings
Kissinger, G. ; Grabolla, T. ; Morgenstern, G. ; Richter, H. ; Graef, D. ; Vanhellemont, J. ; Lambert, U. ; von Ammon, W.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.74-87,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
8.

Conference Proceedings

Conference Proceedings
Kissinger, G. ; Morgenstern, G. ; Richter, H. ; Vanhellemont, J. ; Graef, D. ; Lambert, U. ; von Ammon, W. ; Wagner, P.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.32-39,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
9.

Conference Proceedings

Conference Proceedings
Huebers, H.-W. ; Semenov, A. ; Richter, H. ; Birk, M. ; Krocka, M. ; Mair, U. ; Smirnov, K. ; Gol'tsman, G.N. ; Voronov, B.M.
Pub. info.: Millimeter and submillimeter detectors for astronomy : 25-28 August 2002, Waikoloa, Hawaii, USA.  pp.395-401,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4855
10.

Conference Proceedings

Conference Proceedings
Birkmann, S. M. ; Eberle, K. ; Grozinger, U. ; Lemke, D. ; Schreiber, J. ; Barl, L. ; Katterloher, R. ; Poglitsch, A. ; Schubert, J. ; Richter, H.
Pub. info.: Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.437-447,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5487