Al-Jaberi, M. ; Richardson, M. ; Coath, J. ; Jenkin, R.
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Modeling and simulation for military applications : 18-21 April 2006, Kissimmee, Florida, USA. pp.622814-622814, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Walmsley, R. ; Butters, B. ; Ayling, R. ; Richardson, M.
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Technologies for optical countermeasures II ; Femtosecond phenomena II ; and, Passive millimetre-wave and terahertz imaging II : 26-28 September 2005, Bruges, Belgium. pp.59890C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Barbu, C. ; Valent, P. ; Richardson, M. ; Abelev, A. ; Plant, N.
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Detection and remediation technologies for mines and minelike targets IX : 12-16 April 2004, Orlando, Florida, USA. pp.1292-1299, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Al-Rabban, M. ; Keyser, C. ; George, S. ; Scott, H. ; Bakshi, V. ; Richardson, M.
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Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA. pp.168-177, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
George, S. ; Koay, C.-S. ; Takenoshita, K. ; Bernath, R. ; Al-Rabban, M. ; Keyser, C. ; Bakshi, V. ; Scott, H. ; Richardson, M.
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Emerging lithographic technologies IX : 1-3 March 2005, San Jose, California, USA. pp.178-189, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silva, H. ; Costa, J.D. ; Ferreira, J.M. ; Richardson, M.
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Advanced materials forum II : proceedings of the II International Materials Symposium, Materiais 2003 and XI Encontro Sociedade Portugesa de Materiais - SPM, Campus da Caparica, April 14-16, Caparica, Portugal, 2003. pp.472-475, 2004. Uetikon-Zuerich. Trans Tech Publications
Gonzales, P. ; Bernath, R. ; Duncan, J. ; Olmstead, T. ; Richardson, M.
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Optical Micro- and Nanometrology in Manufacturing Technology. pp.265-272, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering