1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF INTERFACIAL ROUGHNESS IN SEMICONDUCTOR HETEROSTRUCTURES BY X-RAY REFLECTIVITY
Krol, A. ; Sher, C. J. ; Resat, H. ; Woronick, S. C. ; Ng, W. ; Kao, Y. H. ; Chang, L. L. ; Hong, J. M.
Pub. info.: Multilayers : synthesis, properties, and non-electronic applications : symposium held December 2-4, 1987, Boston, Massachusetts, U.S.A..  pp.355-358,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 103
2.

Conference Proceedings
Conference Proceedings
2. FRET measurements between small numbers of molecules identifies subtle changes in receptor interactions
Ozcelik, S. ; Orr, G. ; Hu, D. ; Chen, C.-S. ; Resat, H. ; Harms, G.S. ; Opresko, L.K. ; Wiley, H.S. ; Colson, S.D.
Pub. info.: Multiphoton Microscopy in the Biomedical Sciences IV.  pp.119-127,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5323