1.

Conference Proceedings
Conference Proceedings
1. Arithmetic gain of the lifting scheme
Reichel,J.
Pub. info.: Wavelets : applications in signal and image processing IX : 30 Juy-1 August 2001, San Diego, USA.  pp.98-104,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4478
2.

Conference Proceedings
Conference Proceedings
2. Image-compression-related contrast-masking measurements
Nadenau,M.J. ; Reichel,J.
Pub. info.: Human vision and electronic imaging V : 24-27 January 2000, San Jose, USA.  pp.188-199,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3959
3.

Conference Proceedings
Conference Proceedings
3. Compression of color images with wavelets considering the HVS
Nadenau,M.J. ; Reichel,J.
Pub. info.: Human vision and electronic imaging IV : 25-28 January 1999, San Jose, California.  pp.129-140,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3644
4.

Conference Proceedings
Conference Proceedings
4. Correlations between TD Annihilation and Oxygen Precipitation in Czochralski-Grown Silicon
Reiche,M. ; Reichel,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.643-648,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings
Conference Proceedings
5. Integer wavelet decomposition for lossy image compression
Reichel,J. ; Menegaz,C. ; Nadenau,M.J.
Pub. info.: Applications of digital image processing XXII : 20-23 July 1999, Denver, Colorado.  pp.257-268,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3808