7th AIAA/USAF/NASA/ISSMO Symposium on Multidisciplinary Analysis and Optimization : a collection of technical papers, September 2-4, 1998/St. Louis, Missouri. pt. 1 pp.650-660, 1998. Reston, VA. American Institute of Aeronautics and Astronautics
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AIAA Paper : Symposium on Multidisciplinary Analysis and Optimization
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III. pp.167-178, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XI. pp.322-331, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
28th AIPR Workshop: 3D Visualization for Data Exploration and Decision Making. pp.113-121, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering