Electro-optical remote sensing : 26-28 September 2005, Bruges, Belgium. pp.598806-598806, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Long-wavelength semiconductor devices, materials, and processes : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.141-146, 1991. Pittsburgh, Pa.. Materials Research Society
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.402-413, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Anderson, J.S. ; Bradley, D. ; Chen, C.W. ; Chin, R. ; Gonzalez, H. ; Hegg, R.G. ; Kostrzewa, K. ; Pere, C.L. ; Ton, S. ; Kennedy, A. ; Murphy, D.F. ; Ray, M. ; Wyles, R. ; Miller, J.E. ; Newsome, G.W.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.557-563, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Murphy, D. ; Ray, M. ; Kennedy, A. ; Wyles, J. ; Hewitt, C. ; Wyles, R. ; Gordon, E. ; Sessler, T. ; Baur, S. ; Van Lue, D. ; Anderson, S. ; Chin, R. ; Gonzalez, H. ; Le Pere, C. ; Ton, S. ; Kostrzewa, T.
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Infrared technology and applications XXXI : 28 March-1 April 2005, Orlando, Florida, USA. pp.448-459, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Barr, T. L. ; Kramer, B. ; Shah, S. I. ; Ray, M. ; Greene, J. E.
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Thin films : the relationship of structure to properties : symposium held April 15-17, 1985, San Francisco, California, U.S.A.. pp.205-234, 1985. Pittsburgh, Pa.. Materials Research Society
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Infrared and passive millimeter-wave imaging systems : design, analysis, modeling, and testing : 3-5 April 2002, Orland, USA. pp.107-112, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Murphy, D.F. ; Ray, M. ; Wyles, R. ; Asbrock, J.F. ; Lum, N.A. ; Wyles,J. ; Hewitt, C. ; Kennedy, A. ; Van Lue, D. ; Anderson, J.S. ; Bradley, D. ; Chin, R. ; Kostrzewa, T.
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Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA. pp.99-110, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering