Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.92-102, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.23-33, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.14-22, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA. pp.64-73, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.178-188, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.205-212, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA. pp.249-255, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida. pp.256-263, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Unattended ground sensor technologies and applications II : 26 April 2000, Orlando, [Florida] USA. pp.65-71, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advances in X-ray optics : 2-4 August 2000, San Diego, USA. pp.274-284, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering