1.

Conference Proceedings
Conference Proceedings
1. The Influence of HF, 0H, and Dissolved 02 on Silicon Surface Chemical Cleaning
Higashi, G.S. ; Chabal, Y.J. ; Raghavachari, K. ; Becker, R.S. ; Green, M.P. ; Hanson, K. ; Boone, T. ; Eisenberg, J.H. ; Shive, S.F. ; DiBello, G.N. ; Fulford, K.L.
Pub. info.: Proceedings of the fourth International Symposium on Ultra Large Scale Integration Science and Technology : ULSI science and technology/1993.  pp.189-198,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-13
2.

Conference Proceedings
Conference Proceedings
2. Fullerene Derivatives with Nitrogen Bridging
Raghavachari, K.
Pub. info.: Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials.  pp.1288-1296,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-10
3.

Conference Proceedings
Conference Proceedings
3. INFRARED SPECTROSCOPY OF Si (111) AND Si (100) SURFACES AFTER HF TREATMENT: HYDROGEN TERMINATION AND SURFACE MORPHOLOGY
Chabal, Y.J. ; Higashi, G.S. ; Raghavachari, K.
Pub. info.: Chemical perspectives of microelectronic materials : symposium held November 30-December 2, 1988, Boston, Massachusetts, U.S.A..  pp.191-196,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 131
4.

Conference Proceedings
Conference Proceedings
4. Spectroscopic and Theoretical Investigations of Hydrogen-Induced Exfoliation of Silicon: Si-H Bending Modes
Caudano, Y. ; Weldon, M.K. ; Chabal, Y.J. ; Stefanov, B.B. ; Raghavachari, K. ; Jacobson, D.C. ; Christman, S.B. ; Chaban, E.E.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.365-372,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
5.

Conference Proceedings
Conference Proceedings
5. RAMAN SPECTROSCOPY OF SIZE SELECTED, MATRIX ISOLATED Si CLUSTERS
Ogura, A. ; Honea, E. C. ; Murray, C. A. ; Raghavachari, K. ; Sprenger, W. O. ; Jarrold, M. F. ; Brown, W. L.
Pub. info.: Determining nanoscale physical properties of materials by microscopy and spectroscopy.  pp.333-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 332
6.

Conference Proceedings
Conference Proceedings
6. Hot Water Etching of Silicon Surfaces: New Insights of Mechanistic Understanding and Implications to Device Fabrication
Rosamilia, J. M. ; Boone, T. ; Sapjeta, J. ; Raghavachari, K. ; Higashi, G. S. ; Liu, Q.
Pub. info.: Science and technology of semiconductor surface preparation : symposium held April 1-3, 1997, San Francisco, California, U.S.A..  pp.181-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 477
7.

Conference Proceedings
Conference Proceedings
7. Exohedral and Endohedral Isomers of C600: Interconversion by a Window Mechanism
Raghavachari, K.
Pub. info.: Proceedings of the symposium on recent advances in the chemistry and physics of fullerenes and related materials.  pp.205-212,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-24
8.

Conference Proceedings
Conference Proceedings
8. Silicon Surface Chemistry by IR Spectroscopy in the Mid- to Far-IR Region: H2O and Ethanol on Si(100)
Struck, L. M. ; Eng, J., Jr. ; Bent, B. E. ; Chabal, Y. J. ; Williams, G. P. ; White, A. E. ; Christman, S. ; Chaban, E. E. ; Raghavachari, K. ; Flynn, G. W. ; Radermacher, K. ; Mantl, S.
Pub. info.: Ultraclean semiconductor processing technology and surface chemical cleaning and passivation : Symposum held April 17-19, 1995, San Francisco, California, USA.  pp.395-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 386