1.

Conference Proceedings
Conference Proceedings
1. Time-resolved imaging of material response during laser-induced bulk damage in Si02
S. G. Demos ; R. A. Negres
Pub. info.: Laser-Induced Damage in Optical Materials: 2008.  pp.71320Q-1-71320Q-10,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7132
2.

Conference Proceedings
Conference Proceedings
2. Interactions between x-ray induced transient defects and pre-existing damage precursors in DKDP crystals
R. A. Negres ; C. K. Saw ; S. G. Demos
Pub. info.: Laser-Induced Damage in Optical Materials: 2008.  pp.713212-1-713212-7,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7132
3.

Conference Proceedings
Conference Proceedings
3. Does complex absorption behavior leading to conditioning and damage in KDP/DKDP reflect the electronic structure of initiators?
M. D. Feit ; P. P. DeMange ; R. A. Negres ; A. M. Rubenchik ; S. G. Demos
Pub. info.: Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado.  pp.672005-1-672005-8,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6720
4.

Conference Proceedings
Conference Proceedings
4. Pump and probe damage testing for investigation of transient material modifications associated with laser damage in optical materials
R. A. Negres ; M. D. Feit ; P. DeMange ; J. D. Bude ; S. G. Demos
Pub. info.: Laser-induced damage in optical materials : 2007 : 39th Annual Boulder Damage Symposium : proceedings : 24-26 September, 2007, Boulder, Colorado.  pp.672019-1-672019-6,  2007.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6720