Ultraviolet ground- and space-based measurements, models, and effects : 30 July-1 August 2001, San Diego, USA. pp.367-380, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.61-65, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.93-96, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.1-3, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.8-13, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Imaging system technology for remote sensing : 16-17 September 1998, Beijing, China. pp.79-87, 1998. Bellingham. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China. pp.97-101, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China. pp.45-49, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Micro- and nano-photonic materials and devices : 27-28 January 2000, San Jose, California. pp.97-105, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering