1.

Conference Proceedings
Conference Proceedings
1. Estimating cross-section semiconductor structure by comparing top-down SEM images
Price, J.R. ; Bingham, P.R. ; Tobin, K.W. Jr., ; Karnowski, T.P.
Pub. info.: Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA.  pp.161-170,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5011
2.

Technical Paper
Technical Paper
2. Ceramic Stationary Gas Turbine Program - Monolithic Ceramic Component.
Van Roode, M. ; Price, J.R. ; Richerson, D.W. ; Parthaasarathy, V. ; Graves, G.A.
Pub. info.: A.S.M.E. paper.  2001.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 2001
3.

Conference Proceedings
Conference Proceedings
3. Sidewall structure estimation from CD-SEM for lithographic process control
Bingham, P.R. ; Price, J.R. ; Tobin, K.W., Jr. ; Karnowski, T.P. ; Bennett, M.H. ; Bogardus, E.H. ; Bishop, M.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.115-126,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041
4.

Conference Proceedings
Conference Proceedings
4. Detection of cavitation pits on steel surfaces using SEM imagery
Price, J.R. ; Hylton, K.W. ; Tobin, K.W., Jr. ; Bingham, P.R. ; Hunn, J.D. ; Haines, J.R.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.476-484,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
5.

Conference Proceedings
Conference Proceedings
5. Semiconductor sidewall shape estimation using top-down CD-SEM image retrieval
Price, J.R. ; Bingham, P.R. ; Tobin, K.W., Jr. ; Karnowski, T.P.
Pub. info.: Sixth International Conference on Quality Control by Artificial Vision.  pp.209-219,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5132
6.

Conference Proceedings
Conference Proceedings
6. Optical inspection of coated-particle nuclear fuel
Price, J.R. ; Hunn, J.D.
Pub. info.: Machine Vision Applications in Industrial Inspection XII.  pp.137-149,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5303