1.

Conference Proceedings

Conference Proceedings
Ganichev,S.D. ; Mayerhofer,B. ; Yassievich,I.N. ; Diener,J. ; Prettl,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1543-1546,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Ganichev,S.D. ; Yassievich,I.N. ; Prettl,W. ; Diener,J. ; Meyer,B.K. ; Benz,K.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1079-1084,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings

Conference Proceedings
Nuebler-Moritz,M. ; Gutknecht,N. ; Sailer,H.F. ; Hering,P. ; Prettl,W.
Pub. info.: Lasers in Dentistry III.  pp.178-188,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2973
4.

Conference Proceedings

Conference Proceedings
Nuebler-Moritz,M. ; Gutknecht,N. ; Sailer,H.F. ; Hering,P. ; Prettl,W.
Pub. info.: Lasers in Dentistry III.  pp.150-156,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2973