1.

Conference Proceedings
Conference Proceedings
1. Environmental test bench for reliability studies: influence of the temperature on rf switches with metallic membranes
Lafontan, X. ; Le Touze, C. ; Wenk, B. ; Kolesnik, I. ; Pressecq, F. ; Perez, G. ; Nicot, J.-M. ; Dardalhon, M. ; Rigo, S.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France.  pp.624-633,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4755
2.

Conference Proceedings
Conference Proceedings
2. ONES Activities on ASICs
Ecoffet, R. ; Pressecq, F. ; Venturin, J.-L.
Pub. info.: Proceedings of the ESA Electronic Components Conference, held at the Conference Centre, ESTEC, Noordwijk, the Netherlands, 12-16 November 1990.  pp.57-62,  1991.  Paris.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 313
3.

Technical Paper
Technical Paper
3. MEMS Reliability: From Experimental Results to the Understanding of Physical Phenomena
Pressecq, F. ; Schmitt, P. ; Veyrie, D. ; Duong, Q. ; Lafontan, X. ; Lellouchi, D.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Conference on Micro-Nano-Technologies
Ser. no.: 2004
4.

Conference Proceedings
Conference Proceedings
4. Hot Carrier Reliability Simulation for CMOS Analog Circuits
Pressecq, F. ; Bordonado, B. ; Noullet, J.L.
Pub. info.: Proceedings of the Third ESA Electronic Components Conference, EECC '97, ESTEC, Noordwijk, The Netherlands, 22-25 April 1997.  pp.345-350,  1997.  Noordwijk, The Netherlands.  European Space Agency
Title of ser.: ESA SP
Ser. no.: 395
5.

Conference Proceedings
Conference Proceedings
5. Automatic Generation of Analog CMOS Cells
Morel, J.B. ; Pressecq, F.
Pub. info.: Proceedings of the Third ESA Electronic Components Conference, EECC '97, ESTEC, Noordwijk, The Netherlands, 22-25 April 1997.  pp.341-343,  1997.  Noordwijk, The Netherlands.  European Space Agency
Title of ser.: ESA SP
Ser. no.: 395
6.

Technical Paper
Technical Paper
6. Space Microsystems and Reliability: The Contribution of Behavioral Modeling
Schmitt, P. ; Nicot, J. ; Pressecq, F. ; Lafontan, X. ; Oudea, C. ; Esteve, D.
Pub. info.: AIAA meeting papers on disc.  2004.  [Reston, Va.].  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Conference on Micro-Nano-Technologies
Ser. no.: 2004
7.

Conference Proceedings
Conference Proceedings
7. Reliability issues of an accelerometer under environmental stresses
Schmitt, P. ; Pressecq, F. ; Perez, G. ; Lafontan, X. ; Nicot, J.M. ; Esteve, D. ; Fourniols, J.Y. ; Camon, H. ; Oudea, C.
Pub. info.: Reliability, Testing, and Characterization of MEMS/MOEMS III.  pp.22-30,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5343
8.

Conference Proceedings
Conference Proceedings
8. Hermeticity tests on organically sealed micro-packages using FTIR spectroscopy [6111-31]
Roux, J.-L. ; Pressecq, F. ; Tetelin, A. ; Pellet, C. ; IXL,
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V.  pp.61110R-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6111