1.

Conference Proceedings
Conference Proceedings
1. THIN Ni SILICIDE FORMATION BY LOW TEMPERATURE-INDUCED METAL ATOM REACTION WITH ION IMPLANTED AMORPHOUS SILICON
Erokhin, Yu.N. ; Patnaik, B.K. ; Pramanick, S. ; Hong, F. ; White, C.W. ; Rozgonyi, G.A.
Pub. info.: Beam-solid interactions : fundamentals and applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.237-242,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 279
2.

Conference Proceedings
Conference Proceedings
2. STABILITY OF NANCOSCALE COBALT SILICDE FILM FORMATION ON POLYSILICON
Pramanick, S. ; Erokhin, Yu N. ; Patnaik, B. K. ; Rozgonyi, G.A. ; Gambino, J. P.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.435-440,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
3.

Conference Proceedings
Conference Proceedings
3. IN-SITU OPTICAL EMISSION SPECTRA OF Ti, TiN AND TiSi2 PLASMA DURING THIN FILM GROWTH BY PULSED LASER EVAPORATION
Pramanick, S. ; Narayan, J.
Pub. info.: Chemical vapor deposition of refractory metals and ceramics II : symposium held December 4-6, 1991, Boston, Massachusetts, U.S.A..  pp.125-130,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 250
4.

Conference Proceedings
Conference Proceedings
4. AGGLOMERATION-FREE NANOSCALE COBALT SILICIDE FILM FORMATION VIA SUBSTRATE PREAMORPHIZATION
Pramanick, S. ; Patnaik, B. K. ; Rozgonyi, G. A.
Pub. info.: Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.475-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 309
5.

Conference Proceedings
Conference Proceedings
5. EFFECT OF MECHANICAL STRESS ON ELECTROMIGRATION FAILURE MODE DURING ACCELERATED ELECTROMIGRATION TESTS
Pramanick, S. ; Brown, D. D. ; Pham, V, ; Besser, P. ; Sanchez, J. ; Bui, N. ; Hijab, R. ; Yue, J. T.
Pub. info.: Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.507-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 356