1.

Conference Proceedings

Conference Proceedings
Yin, X. ; Pollak, Fred H. ; McDermott, B.T. ; Reid, K.G. ; Bedair, S.M.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.679-684,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
2.

Conference Proceedings

Conference Proceedings
Rockwell, Benjamin ; Chandrasekhar, H.R. ; Chandrasekhar, Meera ; Pollak, Fred H. ; Shen, H. ; Chang, L.L. ; Wang, W.I. ; Esaki, L.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.751-758,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
3.

Conference Proceedings

Conference Proceedings
Dorfman, Benjamin F. ; Asoka-Kumar, P. ; Pollak, Fred H. ; Wan, J. Z. ; Zhu, Qing
Pub. info.: Materials for mechanical and optical microsystems : symposium held December 4-5, 1996, Boston, Massachusetts,U.S.A..  pp.15-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 444
4.

Conference Proceedings

Conference Proceedings
Wan, J. Z. ; Pollak, Fred H. ; Dorfman, Benjamin F.
Pub. info.: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.647-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 441
5.

Conference Proceedings

Conference Proceedings
Qiang, H. ; Yan, D. ; Yin, Yichun ; Pollak, Fred H.
Pub. info.: Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A..  pp.513-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 326
6.

Conference Proceedings

Conference Proceedings
Dorfman, B. ; Abraizov, M. ; Pypkin, B. ; Strongin, M. ; Yang, X.-Q. ; Yan, D. ; Pollak, Fred H. ; Grow, J. ; Levy, R.
Pub. info.: Molecularly designed ultrafine/nanostructured materials : symposium held April 4-8, 1994, San Francisco, California, U.S.A..  pp.43-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 351
7.

Conference Proceedings

Conference Proceedings
Krystek, Wojciech ; Liebovitch, M. ; Pollak, Fred H. ; Gumbs, Godfrey ; Konopelski, T.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.241-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
8.

Conference Proceedings

Conference Proceedings
Krystek, Wojciech ; Pollak, Fred H. ; Feng, Z. C. ; Schurman, M. ; Stall, R. A.
Pub. info.: Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.573-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 482
9.

Conference Proceedings

Conference Proceedings
Florescu, D. I. ; Pollak, Fred H. ; Lanford, William B. ; Khan, Farid ; Adesida, I. ; Molnar, R. J.
Pub. info.: GaN and related alloys - 2000 : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 639
10.

Conference Proceedings

Conference Proceedings
Pollak, Fred H. ; Wan, J. Z. ; Dorfman, Benjamin F.
Pub. info.: Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A..  pp.233-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 466