Pollak, F.H. ; Gavrilenko, V.I. ; Krystek, W. ; Freeouf, J.L. ; Streit, D.C. ; Wojtowicz, M.
Pub. info.:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.255-266, 1997. Pennington, NJ. Electrochemical Society
Aigouy, L. ; Holden, T. ; Pollak, F.H. ; Ledentsov, N.N. ; Ustinov, V.M. ; Kop'ev, P.S. ; Bimberg, D.
Pub. info.:
Proceedings of the Fourth International Symposium on Quantum Confinement : nanoscale materials, devices, and systems. pp.146-154, 1997. Pennington, NJ. Electrochemical Society
Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.365-368, 1990. Pittsburgh, Pa.. Materials Research Society
Warren, A.C. ; Woodall, J.M. ; Burroughes, J.H. ; Kirchner, P.D. ; Heinrich, H.K. ; Arjavalingam, G. ; Katzenellenbogen, N. ; Grischkowsky, D. ; Melloch, M.R. ; Otsuka, N. ; Mahalingam, K. ; Pollak, F.H. ; Yin, X.
Pub. info.:
Low temperature (LT) GaAs and related materials : symposium held December 4-6, 1991, Boston, Massachusetts, U.S.A.. pp.15-26, 1992. Pittsburgh, Pa.. Materials Research Society
Zou, J. ; Kotchetkov, D. ; Balandin, A.A. ; Florescu, D.I. ; Pollak, F.H.
Pub. info.:
Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.481-486, 2002. Warrendale, Pa. Materials Research Society