1.

Conference Proceedings
Conference Proceedings
1. Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources
Poletto,L. ; Tondello,G.
Pub. info.: X-ray optics, instruments, and missions IV : 30-31 July 2000, San Diego, USA.  pp.182-202,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4138
2.

Conference Proceedings
Conference Proceedings
2. First realization and characterization of multilayer EUV reflective coatings
Nicolosi,P. ; Patelli,A. ; Pelizzo,M.G. ; Rigato,V. ; Maggioni,G. ; Depero,L. ; Bontempi,E. ; Mattei,G. ; Poletto,L. ; Mazzoldi,P. ; Tondello,G.
Pub. info.: Soft X-ray and EUV imaging systems II : 31 July-1 August 2001, San Diego, USA.  pp.76-83,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4506
3.

Conference Proceedings
Conference Proceedings
3. Resolution improvement technique for two-dimensional detectors
Poletto,L. ; Nicolosi,P. ; Barana,O.
Pub. info.: New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG.  pp.83-94,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3101
4.

Conference Proceedings
Conference Proceedings
4. Soft x-ray(2 to 6 keV)spectroscopy using gratings at extreme grazing incidence
Boscolo,A. ; Poletto,L. ; Tondello,G.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.260-266,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805
5.

Conference Proceedings
Conference Proceedings
5. Performances of a CCD camera from 1-to 1100-nm spectral region
Poletto,L. ; Boscolo,A. ; Pelizzo,M.G. ; Placentino,L. ; Tondello,G.
Pub. info.: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.132-141,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3100
6.

Conference Proceedings
Conference Proceedings
6. Quantum efficiency measurement on a CCD detector in the 0.3-to 1100-nm spectral region
Poletto,L. ; Boscolo,A. ; Pelizzo,M. G. ; Placentino,L. ; Tondello,G.
Pub. info.: EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.  pp.617-624,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3114
7.

Conference Proceedings
Conference Proceedings
7. Spectrometer for UVISS telescope on the space station
Naletto,G. ; Poletto,L. ; Zuccaro,A.
Pub. info.: Instrumentation for UV/EUV astronomy and solar missions :30 July- 1 August 2000 San Diego, USA.  pp.211-222,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4139
8.

Conference Proceedings
Conference Proceedings
8. EUV and soft x-ray telescope-spectrometer for imaging spectroscopy on the Solar Orbiter mission: grazing-incidence configuration
Poletto,L. ; Tondello,G. ; Landini,M.
Pub. info.: UV/EUV and visible space instrumentation for astronomy and solar physics : 1-2 August 2001, San Diego, USA.  pp.39-50,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4498
9.

Conference Proceedings
Conference Proceedings
9. EUV and soft x-ray telescope-spectrometer for imaging spectroscopy on the Solar Orbiter mission: configurations with multilayer-coated optics
Poletto,L. ; Tondello,G. ; Landini,M.
Pub. info.: UV/EUV and visible space instrumentation for astronomy and solar physics : 1-2 August 2001, San Diego, USA.  pp.51-62,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4498
10.

Conference Proceedings
Conference Proceedings
10. Optical performance and characterization of an EUV and soft x-ray test facility
Poletto,L. ; Boscolo,A. ; Tondello,G.
Pub. info.: Ultraviolet and x-ray detection, spectroscopy and polarimetry III : 19-20 July 1999, Denver, Colorado.  pp.94-102,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3764