1.

Conference Proceedings
Conference Proceedings
1. Characterization of a Single Wafer Multi-Chamber Clustered EPI System at Reduced Pressure
Borland, J. ; Carlson, D. ; Riggi, C. ; Florendo, L. ; Pohl, C. ; Gong, B. ; Hey, P.
Pub. info.: Proceedings of the Twelfth International Symposium on Chemical Vapor Deposition.  pp.147-155,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-2
2.

Conference Proceedings
Conference Proceedings
2. Detection of active faults using data fusion techniques-case study: psachna, island of Evoia Greece
Gountromichou, C.C. ; Pohl, C.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology II :23-26 September 2002, Agia Pelagia, Crete, Greece.  pp.133-144,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4886