1.

Conference Proceedings

Conference Proceedings
Gaetz,T.J. ; Podgorski,W.A. ; Cohen,L.M. ; Freeman,M.D. ; Edgar,R.J. ; Jerius,D. ; Van Speybroeck,L.P. ; Zhao,P. ; Kolodziejczak,J.J. ; Weisskopf,M.C.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.77-88,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
2.

Conference Proceedings

Conference Proceedings
Cameron,R.A. ; Aldcroft,T.L. ; Podgorski,W.A. ; Freeman,M.D. ; Shirer,J.J.
Pub. info.: X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany.  pp.658-668,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4012
3.

Conference Proceedings

Conference Proceedings
Kellogg,E.M. ; Cohen,L.M. ; Edgar,R.J. ; Evans,I.N. ; Freeman,M.D. ; Gaetz,T.J. ; Jerius,D. ; McDermott,W.C. ; McKinnon,P.J. ; Murray,S.S. ; Podgorski,W.A. ; Schwartz,D.A. ; Van Speybroeck,L.P. ; Wargelin,B.J. ; Zombeck,M.V. ; Weisskopf,M.C. ; Elsner,R.F. ; O'Dell,S.L. ; Tennant,A.F. ; Kolodziejczak,J.J.
Pub. info.: Grazing incidence and multilayer X-ray optical systems : 27-29 July 1997, San Diego, California.  pp.515-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3113
4.

Conference Proceedings

Conference Proceedings
Romaine,S.E. ; Bruni,R.J. ; Clark,A.M. ; Podgorski,W.A. ; Schultz,D. ; Schwartz,D.A. ; Speybroeck,L.P.Van ; Zhou,Y. ; Hahn,R.E. ; Johnston,G.T. ; Longmire,A.J. ; Humphreys,J.T. ; Shapiro,A.P. ; Tjulander,R.
Pub. info.: Multilayer and grazing incidence X-ray/EUV optics III : 5-6 August, 1996, Denver, Colorado.  pp.8-17,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2805