Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.409-414, 1985. Pittsburgh, Pa.. Materials Research Society
Pike, G. E. ; Hays, A. K. ; Nelson, G. C. ; Fritz, I. K.
Pub. info.:
Thin films : the relationship of structure to properties : symposium held April 15-17, 1985, San Francisco, California, U.S.A.. pp.135-142, 1985. Pittsburgh, Pa.. Materials Research Society
Warren, W. L. ; Pike, G. E. ; Dimos, D. ; Vanheusden, K. ; Al-Shareef, H. N. ; Tuttle, B. A. ; Ramesh, R. ; Evans, J. T., Jr.
Pub. info.:
Ferroelectric thin films V : symposium held April 7-12, 1996, San Francisco, California, U.S.A.. pp.257-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society