1.

Conference Proceedings

Conference Proceedings
Izumi,N. ; Lerche,R.A. ; Phillips,T.W. ; Schmid,G.J. ; Moran,M.J. ; Sangster,T.C.
Pub. info.: Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA.  pp.63-70,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4510
2.

Conference Proceedings

Conference Proceedings
Schmid,G.J. ; Glebov,V.Yu ; Friensehner,A.V. ; Hargrove,D.R. ; Hatchett,S.P. ; Izumi,N. ; Lerche,R.A. ; Phillips,T.W. ; Sangster,T.C. ; Silbernagel,C.T. ; Stoeckl,C.
Pub. info.: Charged particle detection, diagnostics, and imaging : 30 July - 2 August 2001 San Diego, USA.  pp.12-19,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4510
3.

Conference Proceedings

Conference Proceedings
Wilks,S.C. ; Cowan,T.E. ; Brown,C.G. ; Fountain,W.F. ; Hatchett,S.P. ; Johnson,J. ; Key,M.H. ; Pennington,D.M. ; Perry,M.D. ; Phillips,T.W. ; Sangster,T.C. ; Singh,M.S. ; Snavely,R.A. ; Stoyer,M.A. ; Wilks,S.C. ; Yasuike,K.
Pub. info.: ECLIM 2000 : 26th European Conference on Laser Interaction with Matter, 12-16 June, 2000, Prague, Czech Republic.  pp.463-466,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4424