Signal processing, sensor fusion, and target recognition XII : 21-23 April 2003, Oriando, Florida, USA. pp.597-606, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Unattended ground sensor technologies and applications IV : 2-5 April 2002 Orland, USA. pp.50-61, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Signal processing, sensor fusion, and target recognition XIII : 12-14 April 2004, Oriando, Florida, USA. pp.421-427, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Unattended/unmanned ground, ocean, and air sensor technologies and applications VI : 12-15 April 2004 Orland, USA. pp.24-30, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Robertson, N. D. ; Pham, T. ; Scanlon, V. M. ; Srour, N. ; Reiff, G. C. ; Sim, K. L. ; Solomon, L. ; Thompson, F. D.
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Unattended ground, sea, and air sensor technologies and applications VIII : 17-20 April 2006, Kissimmee, Florida, USA. pp.62310V-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Johnson, A. ; Pearce, R. ; Waltrip, M. ; Pham, T. ; Jennings, P. ; Branning, J.
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Environmental issues in the electronics and semiconductor industries : proceedings of the second international symposium. pp.135-146, 1999. Pennington, NJ. Electrochemical Society
Catanzaro, B.E. ; Pham, T. ; Olmi, L. ; Martinson, K.E. ; Devlin, M.
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Infrared spaceborne remote sensing X : 10-11 July 2002, Seattle, Washington, USA. pp.71-78, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Document recognition and retrieval X : 22-24 January 2003, Santa Clara, California, USA. pp.20-27, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Orbon, J. ; Levin, L. ; Bokobza, O. ; Shimshi, R. ; Dutta, M. ; Zhang, B. ; Ciplickas, D. ; Pham, T. ; Jensen, J.
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Data analysis and modeling for process control : 26-27 February 2004, Santa Clara, California, USA. pp.142-150, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering