Advanced characterization techniques for optical, semiconductor, and data storage components : 9-11 July 2002 Seattle, Washington, USA. pp.52-59, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Baek, S. Y. ; Edwards, R. ; Thomas, C. L. ; Peterson, R.
Pub. info.:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.629-632, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Peterson, R. ; Novokov, M. ; Hsu, J. ; Gass, H. ; Benson, M.
Pub. info.:
Technologies for synthetic environments : hardware-in-the-loop testing VII : 1-2 April 2001, Orlando, USA. pp.56-67, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering