1.

Conference Proceedings
Conference Proceedings
1. Epitaxy on GaN bulk crystals
Leszczynski,M. ; Prystawko,P. ; Czernecki,R. ; Lehnert,J. ; Perlin,P. ; Wisniewski,P. ; Skierbiszewski,Cz. ; Suski,T. ; Nowak,G. ; Karouta,F. ; Holst,J. ; Grzegory,I. ; Porowski,S.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.11-15,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings
Conference Proceedings
2. Nonlinear optical characterization of single-crystalline GaN by Z-scan technique
Pacebutas,V. ; Stalnionis,A. ; Krotkus,A. ; Leszczynski,M. ; Perlin,P. ; Suski,T.
Pub. info.: Smart optical inorganic structures and devices : 16-19 August 2000, Vilnius, Lithuania.  pp.135-139,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4318
3.

Conference Proceedings
Conference Proceedings
3. Luminescence of nonthermalized electron-hole plasma in GaN epilayers
Jursenas,S. ; Kurilcik,G. ; Kurilcik,N. ; Tamulaitis,G. ; Kazlauskas,K. ; Zukauskas,A. ; Prystawko,P. ; Leszczynski,M. ; Suski,T. ; Perlin,P. ; Grzegory,I. ; Porowski,S.
Pub. info.: Smart optical inorganic structures and devices : 16-19 August 2000, Vilnius, Lithuania.  pp.123-128,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4318
4.

Conference Proceedings
Conference Proceedings
4. Free Electrons and Resonant Donor State in Gallium Nitride
Perlin,P. ; Suski,T. ; Teisseyre,H. ; Leszczynski,M. ; Grzegory,I. ; Jun,J. ; Bockowski,M. ; Porowski,S. ; Boguslawski,P. ; Bernholc,J. ; Moustakas,T.D.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.23-24,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Luminescence of Doped and Undoped Bulk Crystals of GaN
Teisseyre,H. ; Suski,T. ; Perlin,P. ; Gorczyca,I. ; Leszczynsk,M. ; Grzegory,I. ; Jun,J. ; Porowski,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.43-48,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings
Conference Proceedings
6. Radiation-induced effects research in emerging photonic technologies: vertical-cavity surface-emitting lasers,GaN light-emitting diodes,and microelectromechanical devices
Taylor,E.W. ; Paxton,A.H. ; Schone,H. ; Comotois,J.H. ; Sanchez,A.D. ; Michailcek,M.A. ; Winter,J.E. ; McKinney,S.J ; Osinski,M. ; Perlin,P. ; Carson,R.F ; Bristow,J.P.G ; Lehman,J.A ; Brenner,M.K.Hibbs.
Pub. info.: Photonics for space environments V : 30 July 1997, San Diego.  pp.9-21,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3124
7.

Conference Proceedings
Conference Proceedings
7. Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes
Osinski,M. ; Barton,D.L. ; Helms,C.J. ; Berg,N.H. ; Perlin,P.
Pub. info.: Fabrication, testing, and reliability of semiconductor lasers II : 13-14 February, 1997, San Jose, California.  pp.113-120,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3004
8.

Conference Proceedings
Conference Proceedings
8. Analysis of impurity-related blue emission in Zn-doped GaN/InGaN/AIGaN double heterostructure
Eliseev,P.G. ; Smagley,V.A. ; Perlin,P. ; Sartori,P. ; Osinski,M.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.97-108,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693
9.

Conference Proceedings
Conference Proceedings
9. Current transport and emission mechanisms in high-brightness green InGaN/AlGaN/GaN single quantum well light-emitting diodes
Osinski,M. ; Perlin,P. ; Eliseev,P.G. ; Furioli,J.
Pub. info.: Light-Emitting Diodes: Research, Manufacturing, and Applications.  pp.15-25,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3002
10.

Conference Proceedings
Conference Proceedings
10. Life tests and failure mechanisms of GaN/AlGaN/InGaN light-emitting diodes
Barton,D.L. ; Osiriski,M. ; Perlin,P. ; Helms,C.J. ; Berg,N.H.
Pub. info.: Light-Emitting Diodes: Research, Manufacturing, and Applications II.  pp.17-27,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3279