1.

Conference Proceedings

Conference Proceedings
Zhao,G. ; Zhu,B. ; Peng,X. ; Xu,J. ; Xu,C. ; Yi,L. ; Yang,S. ; Chen,X.
Pub. info.: High-power lasers : solid state, gas, excimer, and other advanced lasers II : 16-18 September 1998, Beijing, China.  pp.128-133,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3549
2.

Conference Proceedings

Conference Proceedings
Zhu,S.M. ; Peng,X. ; Zhang,Z. ; Hu,X.T.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.407-412,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
3.

Conference Proceedings

Conference Proceedings
Peng,X. ; Zhu,S.M. ; Ye,S.H. ; Tiziani,H.J.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.96-104,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
4.

Conference Proceedings

Conference Proceedings
Xu,L. ; Peng,X. ; Miao,J. ; Asundi,A.K.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part B  pp.543-548,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
5.

Conference Proceedings

Conference Proceedings
Peng,X. ; Asundi,A.K. ; Chen,Y. ; Xiong,Z. ; Lim,G.C.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part B  pp.573-580,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
6.

Conference Proceedings

Conference Proceedings
Zhang,Z. ; Peng,X. ; Shi,W. ; Hu,X.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.115-119,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Peng,X. ; Shi,W. ; Zhang,Z. ; Hu,X.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.110-114,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
8.

Conference Proceedings

Conference Proceedings
Wan,C. ; Tan,R. ; Wu,J. ; Liu,S. ; Zhou,J. ; Qi,J. ; Wang,D. ; Wan,P. ; Peng,X. ; Xie,W.
Pub. info.: Advanced high-power lasers : 1-5 November 1999, Osaka, Japan.  pp.725-731,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3889
9.

Conference Proceedings

Conference Proceedings
Peng,X. ; Asundi,A.K. ; Xu,L. ; Chen,Y. ; Xiong,Z. ; Lim,G.C.
Pub. info.: Solid state lasers IX : 25-26 January 2000, San Jose, California.  pp.193-198,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3929
10.

Conference Proceedings

Conference Proceedings
Peng,X. ; Zhang,Y. ; Song,L. ; Hu,X.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.221-224,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086